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Zeitschriftenartikel:

A. Dervic, M. Hofbauer, B. Goll, H. Zimmermann:
"Integrated Fast-Sensing Triple-Voltage SPAD Quenching/Resetting Circuit for Increasing PDP";
IEEE Photonics Technology Letters, Vol. 33 (2021), No. 3; S. 139 - 142.



Kurzfassung englisch:
In this letter we present a fast triple voltage quenching circuit (TVQC) with an integrated 40 µm diameter single-photon avalanche diode (SPAD) in 0.35-µm CMOS: By pre-biasing the switching MOSFETs the reaction time of the TVQC is kept small, leading to a total quenching time of only 1.4 ns of which 0.61 ns are actively quenched. This short reaction time reduces the avalanche charge and therefore also the afterpulsing probability (APP). The dead time is adjustable from 7.9 ns to 200 ns, which allows furrher reducing the APP. Experimental verification shows an APP of 2.1% at a dead time of 30 ns. Using an integrated SPAD with a thick absorption zone allows achieving a photon detection probability (PDP) of 28.8% at 850 nm, while showing a peak PDP of 53.1% at 657 nm, both at 9.9 V excess bias.

Schlagworte:
single-photon avalanche diode (SPAD), quenching circuit, afterpulsing probability, CMOS technology, optical receiver, photon counting


"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/LPT.2020.3044484


Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.