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Talks and Poster Presentations (with Proceedings-Entry):

D. Seyringer, M. Sagmeister, A. Maese-Novo, M. Eggeling, E. Rank, J. Edlinger, P. Muellner, R. Hainberger, W. Drexler, J. Kraft, G. Koppitsch, G. Meinhardt, M. Vlaskovic, H. Zimmermann:
"Compact and High-Resolution 256-Channel Silicon Nitride Based AWG-Spectrometer for OCT on a Chip";
Talk: ICTON 2019, Angers, France; 07-09-2019 - 07-13-2019; in: "2019 21st International Conference on Transparent Optical Networks", (2019), ISBN: 978-1-7281-2779-8; 1 - 4.



English abstract:
We present the design, simulation, and technological verification of a compact 256-channel, 42-GHz silicon
nitride based AWG-spectrometer dedicated to the realization of an on-chip spectral domain optical coherence tomography (SD-OCT) system. The spectrometer was designed for TM-polarized light with a central wavelength
of 850 nm and fabricated with CMOS foundry processes. Spectrometer features small size of (13 x 14) mm2 and
high resolution of 0.1 nm.

Keywords:
arrayed waveguide grating, Si3N4 based AWG, AWG-spectrometer, optical coherence tomography, photonic integrated circuit.


"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ICTON.2019.8840473


Created from the Publication Database of the Vienna University of Technology.