Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):
D. Seyringer, M. Sagmeister, A. Maese-Novo, M. Eggeling, E. Rank, J. Edlinger, P. Muellner, R. Hainberger, W. Drexler, J. Kraft, G. Koppitsch, G. Meinhardt, M. Vlaskovic, H. Zimmermann:
"Compact and High-Resolution 256-Channel Silicon Nitride Based AWG-Spectrometer for OCT on a Chip";
Vortrag: ICTON 2019,
Angers, France;
09.07.2019
- 13.07.2019; in: "2019 21st International Conference on Transparent Optical Networks",
(2019),
ISBN: 978-1-7281-2779-8;
S. 1
- 4.
Kurzfassung englisch:
We present the design, simulation, and technological verification of a compact 256-channel, 42-GHz silicon
nitride based AWG-spectrometer dedicated to the realization of an on-chip spectral domain optical coherence tomography (SD-OCT) system. The spectrometer was designed for TM-polarized light with a central wavelength
of 850 nm and fabricated with CMOS foundry processes. Spectrometer features small size of (13 x 14) mm2 and
high resolution of 0.1 nm.
Schlagworte:
arrayed waveguide grating, Si3N4 based AWG, AWG-spectrometer, optical coherence tomography, photonic integrated circuit.
"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ICTON.2019.8840473
Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.