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Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):

A. Dervic, B. Goll, B. Steindl, H. Zimmermann:
"Transient measurements and mixed quenching, active resetting circuit for SPAD in 0.35 µm high- voltage CMOS for achieving 218 Mcps";
Poster: ICECS 2019, Genova, Italy; 27.11.2019 - 29.11.2019; in: "26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)", (2019), ISBN: 978-1-7281-0996-1; S. 819 - 822.



Kurzfassung englisch:
A fully integrated single-photon avalanche diode (SPAD) using a controllable fast mixed quenching and active resetting circuit (QRC) fabricated in a 0.35-µm high-voltage CMOS process is presented in this paper. The QRC features a
fast active quenching time of 0.52 ns and a minimum dead-time
of 4.57 ns, which corresponds to a maximum count rate of 218 Mcps. To validate the quenching performance, the circuit was
integrated together with a large-area SPAD having an active
diameter of 90 µm with a capacitance of 150 fF. A pad for a
pico-probe was integrated on the chip, leading to a total capacitive load of 275 fF in SPAD cathode“s node during transient measurements.

Schlagworte:
mixed quenching circuit, active resetting circuit, SPAD, photon counting, CMOS, avalanche current transient


"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ICECS46596.2019.8964689


Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.