[Zurück]

M. Mitrovic, M. Hofbauer, K.O. Voss, H. Zimmermann:
"Experimental Investigation of the Joint lnfluence of Reduced Supply Voltage and Charge Sharing on Single-Event Transient Waveforms in 65-nm Triple-Well CMOS";
IEEE Transactions on Nuclear Science, Vol. 65 (2018), No. 8; S. 1908 - 1913.

waveforms of single-event transients (SETs) in inverter chains were measured under focused heavy-ion microbeam irradiation. Inverter chains of varying spacings were irradiated with ^48Ca and ¹⁹⁷ Au ions. The inffuence of changing the supply voltage from subthreshold to nominal Ievel on SET forming and propagation was investigated, and the role of charge sharing is discussed. Key factors that inffuence SET widths and cross sections are identified across the applied range of supply voltages. A simple method is presented for estimating average SET widths at decreased supply voltages, and is based on the SET width measurements at nominal supply voltage, transistor-level simulations, and extracted circuit parameters. The proposed method matches weil with the measured data.

Terms-Analog on-chip measurement, charge sharing, CMOS, heavy ions, single-event effects (SEEs), single-event transients (SETs), supply voltage.

http://dx.doi.org/10.1109/TNS.2018.2823273