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L. Anghel, V. S. Veeravalli, D. Alexandrescu, A. Steininger, K. Schneider, E. Costenaro:
"Single Event Effects in Muller C-Elements and Asynchronous Circuits Over a Wide Energy Spectrum";
Vortrag: 2014 IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE 10), Stanford University, USA; 01.04.2014 - 02.04.2014; in: "Proceedings 2014 IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE 10)", (2014), 6 S.

The C-element is the critical component of asynchronous circuits' control paths. This paper presents a complete analysis of the effect of radiation particle hits on a Van-Berkel C-element in 90nm bulk technology. The alpha particles, neutrons and heavy ions results show significant intrinsic sensitivity to Single Event Transients and Single Event Upsets. Furthermore, we propose a static and dynamic state-aware analysis of individual gates and more complex asynchronous
elements. The methodology allows evaluating the vulnerability intervals of the asynchronous circuit for a given application and implementation, highlighting rendezvous phases where the Celement is susceptible to SEUs, disrupting circuit behavior and requiring a null wave to recover. The results of the analysis can be exploited to predict and improve circuit reliability performance.