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M. Winkler, T. Faseth, H. Arthaber:
"Implementation of an EPC Tag Emulator for Reproduction for Worst Case Test Scenarios";
Talk: The Third International EURASIP Workshop on RFID Technology (RFID 2010), La Manga del Mar Menor, Cartagena, Spain; 09-06-2010 - 09-07-2010; in: "Workshop Proceedings Third International EURASIP Workshop on RFID Technology", (2010), ISBN: 978-84-96997-47-9; 70 - 73.

In this paper the implementation of a configurable hardware for an EPC Class-1 Gen-2 conform backscatter baseband processing unit is demonstrated. Based on a developed UHF RF identification (RFID) tag emulator, the behavior of an RFID tag is precisely emulated not only on the logical layer but also on the physical layer. The variation of the backlink frequency of each backscattered data bit and the timing jitter of the tag's reply can be emulated. The input reflection coefficient of the tag emulator can be continuously changed in the I/Q plane. Therefore, an input power dependent reflection coefficient and a moving tag can be emulated as well as different modulation depths. The influence of different pulse shapes of the backscattered signal can be investigated. It is shown, that reader design and verification under worst case conditions caused by the physical behavior of the tag can be done by this hardware.