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Publication list for
Robert Entner
as author or essentially involved person

17 records (2003 - 2007)


Publications in Scientific Journals

  1. R. Entner, T. Grasser, O. Triebl, H. Enichlmair, R. Minixhofer:
    "Negative Bias Temperature Instability Modeling for High-Voltage Oxides at Different Stress Temperatures";
    Microelectronics Reliability, 47 (2007), 4-5; 697 - 699.
  2. M. Karner, A. Gehring, M. Wagner, R. Entner, S. Holzer, W. Gös, M. Vasicek, T. Grasser, H. Kosina, S. Selberherr:
    "VSP- A Gate Stack Analyzer";
    Microelectronics Reliability, 47 (2007), 4-5; 704 - 708.

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Talks and Poster Presentations (with Proceedings-Entry)

  1. T. Grasser, R. Entner, O. Triebl, H. Enichlmair:
    "TCAD Modeling of Negative Bias Temperature Instability";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Monterey; 09-06-2006 - 09-08-2006; in: "International Conference on Simulation of Semiconductor Processes and Devices 2006", (2006), ISBN: 1-4244-0404-5; 330 - 333.
  2. R. Entner, T. Grasser, H. Enichlmair, R. Minixhofer:
    "Negative Bias Temperature Instability Modeling for High-Voltage Oxides at Different Stress Temperatures";
    Talk: Workshop on Dielectrics in Microelectronics (WODIM), Catania; 06-26-2006 - 06-28-2006; in: "WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Programme and Abstracts", (2006), 96 - 97.
  3. M. Karner, A. Gehring, M. Wagner, R. Entner, S. Holzer, W. Gös, M. Vasicek, T. Grasser, H. Kosina, S. Selberherr:
    "VSP-A Gate Stack Analyzer";
    Talk: Workshop on Dielectrics in Microelectronics (WODIM), Catania; 06-26-2006 - 06-28-2006; in: "WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Program and Abstracts", (2006), 101 - 102.
  4. R. Entner, T. Grasser, H. Enichlmair, R. Minixhofer:
    "Influence of Interface and Oxide Traps on Negative Bias Temperature Instability";
    Poster: Silicon Nanoelectronics Workshop, Honolulu; 06-11-2006 - 06-12-2006; in: "Abstracts IEEE 2006 Silicon Nanoelectronics Workshop", (2006), 163 - 164.
  5. R. Entner, T. Grasser, H. Enichlmair, R. Minixhofer:
    "Investigation of NBTI Recovery During Measurement";
    Talk: Materials Research Society Spring Meeting (MRS), San Francisco; 04-17-2006 - 04-21-2006; in: "San Francisco 2006 MRS Meeting Abstracts", (2006), 110 - 111.
  6. R. Entner, A. Gehring, H. Kosina, T. Grasser, S. Selberherr:
    "Modeling of Tunneling Currents for Highly Degraded CMOS Devices";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "International Conference on Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 219 - 222.
  7. R. Entner, A. Gehring, H. Kosina, T. Grasser, S. Selberherr:
    "Impact of Multi-Trap Assisted Tunneling on Gate Leakage of CMOS Memory Devices";
    Talk: The Nanotechnology Conference and Trade Show, Anaheim; 05-08-2005 - 05-12-2005; in: "NSTI Nanotech Technical Proceedings", Vol. 3 (CDROM ISBN 0-9767985-4-9) (2005), ISBN: 0-9767985-2-2; 45 - 48.
  8. S. Holzer, Ch. Hollauer, H. Ceric, S. Wagner, R. Entner, E. Langer, T. Grasser, S. Selberherr:
    "Three-Dimensional Transient Electro-Thermal Interconnect Simulation for Stress and Electromigration Analysis";
    Poster: The Nanotechnology Conference and Trade Show, Anaheim; 05-08-2005 - 05-12-2005; in: "NSTI Nanotech Technical Proceedings", Vol. 3 (CDROM ISBN: 0-9767985-4-9) (2005), ISBN: 0-9767985-2-2; 620 - 623.
  9. R. Entner, A. Gehring, T. Grasser, S. Selberherr:
    "A Comparison of Quantum Correction Models for the Three-Dimensional Simulation of FinFET Structures";
    Poster: International Spring Seminar on Electronics Technology (ISSE), Sofia; 05-13-2004 - 05-16-2004; in: "Proceedings IEEE International Spring Seminar on Electronics Technology 27th ISSE 2004", IEEE, 1 (2004), ISBN: 0-7803-8422-9; 114 - 117.

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  10. R. Kosik, T. Grasser, R. Entner, K. Dragosits:
    "On the Highest Order Moment Closure Problem";
    Poster: International Spring Seminar on Electronics Technology (ISSE), Sofia; 05-13-2004 - 05-16-2004; in: "Proceedings IEEE International Spring Seminar on Electronics Technology 27th ISSE 2004", IEEE, 1 (2004), ISBN: 0-7803-8422-9; 118 - 120.

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Doctor's Theses (authored and supervised)

  1. R. Entner:
    "Modeling and Simulation of Negative Bias Temperature Instability";
    Reviewer: T. Grasser, G. Magerl; Institut für Mikroelektronik, 2007; oral examination: 08-13-2007.

Diploma and Master Theses (authored and supervised)

  1. R. Entner:
    "Three-Dimensional Device Simulation with MINIMOS-NT Using the Wafer-State-Server";
    Supervisor: T. Grasser, A. Gehring; Institut für Mikroelektronik, 2003.

Scientific Reports

  1. T. Grasser, W. Gös, O. Triebl, Ph. Hehenberger, P.-J. Wagner, P. Schwaha, R. Heinzl, S. Holzer, R. Entner, S. Wagner, F. Schanovsky:
    "3 Year Report 2005-2007";
    Report for Christian Doppler Laboratory for Technology CAD in Microelectronics; 2007; 34 pages.
  2. R. Entner, R. Heinzl, A. Nentchev, E. Ungersböck, M. Wagner, S. Selberherr:
    "VISTA Status Report II";
    2006; 28 pages.
  3. R. Entner, R. Heinzl, Ch. Hollauer, A. Sheikholeslami, R. Wittmann, S. Selberherr:
    "VISTA Status Report I";
    2005; 29 pages.